Vector kerr magnetometry
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United States of America Patent
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Dec 31, 2002
Grant Date -
N/A
app pub date -
Feb 28, 2001
filing date -
Feb 28, 2001
priority date (Note) -
Expired
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Abstract
A system and method for realizing vector Kerr magnetometry are disclosed. The system enables simultaneous longitudinal and transverse Kerr effect measurements at each point on a sample surface. An optional component includes a sample platform for achieving precise linear and rotational relocation. The repositionable platform enables complete, 360 degree characterization about a single point. Additionally, the platform control mechanism may be utilized in obtaining longitudinal and transverse Kerr effect measurements at succeeding points on the surface of a sample. Rapid sample characterization is thus achieved.
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