Method and system for automatically generating reference height data for use in a three-dimensional inspection system
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Dec 17, 2002
Grant Date -
N/A
app pub date -
Feb 17, 2000
filing date -
Feb 17, 2000
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A method and system for automatically generating reference height data for use in a 3D inspection system are provided wherein local reference areas on an object are initially determined and then the height of these local reference areas are determined to generate the reference height data. When the object is a printed circuit board, the local reference areas are located relative to predetermined interconnect sites where solder paste is to be deposited or components placed and from which the relative height of the solder paste or components is to be determined using the reference height data during the subsequent inspection process.
First Claim
Family
International Classification(s)
- [Classification Symbol]
- [Patents Count]
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully