Method for manufacturing semiconductor substrate having an epitaxial film in the trench

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United States of America Patent

PATENT NO 6495294
SERIAL NO

09696951

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Abstract

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A trench is formed in a silicon substrate, and an epitaxial film is formed on the substrate and in the trench. After a part of the epitaxial film formed around an opening portion of the trench is etched, another epitaxial film is formed on the substrate and in the trench. Accordingly, the trench can be filled with the epitaxial films completely. Then, the surface of the substrate is flattened.

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Patent Owner(s)

Patent OwnerAddress
DENSO CORPORATIONKARIYA-CITY AICHI-PREF 448-8661

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Onoda, Kunihiro Nagoya, JP 7 1055
Otsuka, Yoshinori Okazaki, JP 24 324
Sakakibara, Toshio Nishio, JP 30 1034
Urakami, Yasushi Tokai, JP 44 267
Yamauchi, Shoichi Obu, JP 44 1442

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