Test system including a test head with integral device for generating and measuring output having variable current or voltage characteristics
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United States of America Patent
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Dec 3, 2002
Grant Date -
N/A
app pub date -
Jul 15, 1999
filing date -
Jul 15, 1999
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A test system for testing at least one electrical component includes a test head having a mounting assembly for removably attaching the electrical component, and a plurality of test ports for electrically coupling to the electrical component. The test system further includes a voltage and current source located within the test head. The voltage and current source is constructed and arranged so as to provide at least one electrical output, through an interface assembly, to the electrical component. The electrical output has a voltage magnitude within a predetermined voltage range and has a current magnitude within a predetermined current range. The voltage and current source further analyzes the electrical output so as to detect and measure one or more changes to the electrical output caused by the electrical component. The voltage and current source also receives and analyzes a plurality of response signals through the interface assembly from the signal ports of the electrical component. The electrical output is characterized by a plurality of transitions and a predetermined repetition rate between consecutive the transitions.
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