Coin inspection method and device
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United States of America Patent
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Nov 26, 2002
Grant Date -
Aug 16, 2001
app pub date -
Dec 8, 2000
filing date -
Dec 9, 1999
priority date (Note) -
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status (Latency Note)
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Abstract
A coin inspection method and a device which can inspect a coin with a high precision, by extracting a large amount of information from a sensor detection signal waveform. In coin inspection which is performed based on a detection signal waveform of a magnetic sensor disposed along a coin pathway through which the coin passes, a differential waveform of the detection signal waveform is determined, first information indicating a peak position of the differential waveform, second information indicating a value of the detection signal waveform at the peak position of the differential waveform, and third information indicating a value of the differential waveform at the peak position of the differential waveform are extracted, and the extracted first through third information are used to inspect the coin.
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