High-resolution measurement of phase shifts in high frequency phase modulators
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United States of America Patent
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Nov 12, 2002
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app pub date -
Aug 17, 2001
filing date -
Oct 13, 1999
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Abstract
A phase difference to duty-cycle circuit converts a phase shifted signal and a reference signal into a single signal having a duty cycle that is a function of the phase difference between the two signals. The single signal may be further converted to a single direct current (DC) value before being transmitted to external measurement circuitry. The external measurement circuitry, by simply measuring the magnitude of the DC signal, can determine the phase difference between the phase shifted signal and the reference signal. In an alternate embodiment, the phase shift in the target bit of a bit pattern is determined based on measurements of the DC voltage value of the shifted target bit pattern, the DC voltage value of first bit pattern comprising a non-shifted bit pattern representing a zero phase shift of the target bit, and a DC voltage value of a bit pattern comprising a non-shifted bit pattern representing a 100% phase shift of the target bit.
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