Semiconductor catalytic layer and atomic layer deposition thereof

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United States of America Patent

PATENT NO 6479902
SERIAL NO

09609013

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Abstract

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A semiconductor and manufacturing method is provided for device interconnects with a catalytic layer of copper, palladium, nickel, cobalt, silver, or other catalytic material deposited in a atomic layer by atomic layer epitaxy on a barrier layer of tantalum, titanium, tungsten, their nitrides, or a compound thereof between the barrier layer and an electroless seed layer on which conductive channel and via material is deposited.

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Patent Owner(s)

Patent OwnerAddress
AIXTRON INC1139 KARLSTAD DRIVE SUNNYVALE CA 94089

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Galewski, Carl J Aromas, CA 12 1652
Lopatin, Sergey D Santa Clara, CA 82 2467

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