Electron microscope
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United States of America Patent
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Oct 29, 2002
Grant Date -
Mar 21, 2002
app pub date -
Oct 29, 1998
filing date -
Oct 30, 1997
priority date (Note) -
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status (Latency Note)
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Abstract
Relationship among an exciting current of each lens of an irradiation lens system including at least two stages of irradiation lenses and an electron beam aperture, an irradiation electron beam density on a sample and an area of the sample surface irradiated with an electron beam is stored in a form of a table or equations, and an exciting condition of each of the lenses of the irradiation lens system is retrieved from the relationship and set the irradiation lens system to the retrieved condition, for example, when the enlarging magnification is changed under a condition of keeping the irradiation electron beam density at a constant value. Further, trails of a region of the sample surface irradiated with the electron beam is displayed on a display unit.
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