Circuit board testing apparatus and method
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United States of America Patent
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Oct 8, 2002
Issued Date -
N/A
app pub date -
Mar 30, 2001
filing date -
Oct 30, 1997
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A probe is made to contact one end of the test wiring of a circuit board 32, with a head 52 electrostatically coupled to the other end of said wiring. A pulse-like DC voltage is supplied from a signal source 46, and, simultaneously with a switch section SWp turning on, the maximum voltage is applied to the test wiring. If a detection signal is below a specified value, then a computer 44 will read it as 'open' or 'shorting'. Further, a tip 52a of the head 52 is associated with the circuit board 32 only through an insulating sheet 33, so that the tip 52a is kept away from each pad of a pad section 38 on the board at a fixed distance (equivalent to the thickness of insulating sheet 33). Thus, continuity testing may be performed in a non-contact manner by moving head 52 only in X and Y directions without movement in the Z-direction.
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