Contact arm and electronic device testing apparatus using the same
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United States of America Patent
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Sep 24, 2002
Grant Date -
Dec 27, 2001
app pub date -
Jun 22, 2001
filing date -
Jun 23, 2000
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A contact arm for bringing ICs to be tested to contact a contact portion, comprises a holding head for holding said electronic devices, a floating mechanism provided between a drive mechanism for moving close to or away from said contact portion and said holding head for supporting said holding head movable about said drive mechanism, a diaphragm cylinder provided between said drive mechanism and said holding head for adjusting a relative pressing pressure from said drive mechanism to said holding head. A plurality of diaphragm cylinders are provided to one holding head.
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