Test piece analyzing apparatus
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United States of America Patent
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Sep 24, 2002
Issued Date -
N/A
app pub date -
Apr 30, 2001
filing date -
Aug 6, 1998
priority date (Note) -
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Abstract
A test piece analyzing apparatus is provided which includes a releasably fixed absorbent member, a horizontally reciprocative pinching mechanism for simultaneously transferring a plurality of test pieces in a transfer direction, and an optical analyzing assembly provided with a primary illuminator and a secondary illuminator. The second illuminator serves to illuminate the bottom surface of the test piece.
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