Selective flow path alpha particle detector and method of use
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United States of America Patent
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Sep 24, 2002
Issued Date -
N/A
app pub date -
Jul 11, 2000
filing date -
Feb 26, 1997
priority date (Note) -
Expired
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Abstract
A method and apparatus for monitoring alpha contamination are provided in which ions generated in the air surrounding the item, by the passage of alpha particles, are moved to a distant detector location. The parts of the item from which ions are withdrawn can be controlled by restricting the air flow over different portions of the apparatus. In this way, detection of internal and external surfaces separately, for instance, can be provided. The apparatus and method are particularly suited for use in undertaking alpha contamination measurements during the commissioning operations.
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