X-ray tube life prediction method and apparatus
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United States of America Patent
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Sep 17, 2002
Grant Date -
Oct 18, 2001
app pub date -
Nov 25, 1998
filing date -
Nov 25, 1998
priority date (Note) -
Expired
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Abstract
Possible failure of x-ray tubes is predicted by monitoring and analysis of operating parameters considered leading indicators of failure. Historical data for a tube population is analyzed by discriminant analysis to develop a failure prediction algorithm. The algorithm is used to correlate operating parameters, or values derived from the operating parameters with a potential for tube failure. The operating parameters may include anode overcurrent events and spits, or spit rate exceeded errors for a diagnostic system in which the x-ray tube is installed.
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