Industrial inspection method and apparatus using dual energy x-ray attenuation
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United States of America Patent
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Sep 10, 2002
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N/A
app pub date -
Sep 29, 2000
filing date -
Sep 29, 2000
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Expired
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Abstract
An industrial inspection device uses measurements at two x-ray energy to measure the relative proportions of two materials of a binary industrial composition by determining a mass ratio of a preselected selected first and second material expected to be in the binary composition and such as would provide a photoelectric absorption and Compton scattering consistent with the attenuation of the x-rays at the first and second energy. A relative proportion at different locations can be used to develop an image of one basis material. The image can be used to determine whether a product has an unacceptable composition or inclusions of foreign bodies.
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