Methods and apparatus for statistical process control of test
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United States of America Patent
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Aug 27, 2002
Issued Date -
N/A
app pub date -
Jul 10, 2001
filing date -
Mar 29, 2000
priority date (Note) -
Expired
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Abstract
Methods and apparatus for statistical process control of test according to various aspects of the present invention optimize the wait period between applying input signals and collecting output test signal data. In one embodiment, a tester identifies one or more acceptable systems, circuit boards, or components and performs testing to establish baseline test data. The systems, circuit boards, or components are then tested using a series of different waiting periods to generate wait time optimization data. The wait time optimization data and the baseline data are then statistically analyzed, for example using statistical process control techniques, to identify a wait period for which the test process is out of control. An optimized wait period is then selected that is suitable to maintain the test process under control.
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