Combination advanced corneal to topography/wave front aberration measurement
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United States of America Patent
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Aug 6, 2002
Issued Date -
N/A
app pub date -
May 21, 2001
filing date -
Mar 9, 2000
priority date (Note) -
Expired
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Abstract
A method and apparatus for the simultaneous measurement of the anterior and posterior corneal surfaces, corneal thickness, and optical aberrations of the eye. The method employs direct measurements and ray tracing to provide a wide range of measurements for use by the ophthalmic community.
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