Probe apparatus having removable beam probes
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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-
Jul 23, 2002
Grant Date -
N/A
app pub date -
Jun 13, 2000
filing date -
Jun 13, 2000
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An apparatus for electronically testing of bound electrical circuits connected to planar arrayed pads having removable mounted conductive beam probes to simplify the manufacturing and maintaining process. A space transformer comprises from outside electrically accessible conductive holes wherein the guided beam probes are friction resilient resting. In a second embodiment, the friction resilient resting induces a predetermined bending onto the beam probes. This is accomplished by offsetting guiding plates thus imposing a rotational urging on the probe neck within the conductive hole which is just a bare extension of the beam probe.
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