Apparatus and method for measuring remanence curve of a magnetic material

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United States of America Patent

PATENT NO 6407545
SERIAL NO

09442261

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Abstract

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An apparatus and a method for measuring the remanence curve of a magnetic material with high accuracy is disclosed. First and second pulse magnetic field coils generate a rapidly-changing pulse magnetic field in the space where a magnetic material is located. First and second air-core coils generate a space of a zero magnetic field as well as a finite magnetic field gradient around the magnetic material after application of a pulse magnetic field. A detector detects the force generated by the cooperation between the magnetic field gradient and the magnetic moment of the magnetic material. An arithmetic unit 33 determines the residual magnetization characteristic of the magnetic material based on the detection result in the detector.

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Patent Owner(s)

Patent OwnerAddress
FUJITSU LIMITEDKAWASAKI-SHI KANAGAWA 211-8588
TADASHI MIZOGUCHI19-15 NISHIOGIKITA 4-CHOME SUGINAMI-KU KAWASAKI-SHI KANAGAWA 211-8588

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Mizoguchi, Tadashi Tokyo, JP 33 115
Sato, Kenji Kanagawa, JP 538 4969
Uzumaki, Takuya Kanagawa, JP 46 194

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