Test piece analyzing apparatus having a test piece transfer assembly

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United States of America Patent

PATENT NO 6407403
SERIAL NO

09845579

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Abstract

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A test piece analyzing apparatus is provided which includes a releasably fixed absorbent member, a horizontally reciprocative pinching mechanism for simultaneously transferring a plurality of test pieces in a transfer direction, and an optical analyzing assembly provided with a primary illuminator and a secondary illuminator. The second illuminator serves to illuminate the bottom surface of the test piece.

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Patent Owner(s)

Patent OwnerAddress
KYOTO SAIICHI KAGAKU CO LTD57 NISHIAKETA-CHO HIGASHIKUJO MINAMI-KU KYOTO-SHI KYOTO 601-8045

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Murakami, Atsushi Kyoto, JP 130 1463

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