System and method for combining integrated circuit final test and marking
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United States of America Patent
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May 28, 2002
Grant Date -
N/A
app pub date -
Jun 2, 1998
filing date -
Jun 2, 1998
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A testing station tests integrated circuits and determines if the integrated circuits pass or fail predefined tests. The integrated circuits are placed in a pass bin if the integrated circuits passed the tests, or a fail bin if the integrated circuits failed the tests. A marking station marks identification information on the integrated circuits in the pass bin. The testing and marking stations are both included in a single, integrated tester-marker system.
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