Method and load calculator to calculate the temperature distribution of an anode of an X-ray tube
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United States of America Patent
Stats
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Apr 23, 2002
Grant Date -
N/A
app pub date -
Nov 7, 2000
filing date -
Mar 13, 1998
priority date (Note) -
In Force
status (Latency Note)
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Abstract
In a method and a load computer for calculating the space-time temperature distribution in or, on an anode bombarded with electrons in an x-ray tube. The brief-term temperature boost in a surface layer in and around a focus spot on the anode of the x-ray tube is thereby calculated for the time span during and immediately after the electron bombardment of the focal spot, being calculated by the load computer. The load computer then calculates the long-term temperature distribution in the entire volume of the anode, taking into consideration the heat propagation that emanates from the focal spot as well as the heat emission from the surface of the anode. The results of the two calculations are added for determining the temperature distribution on and in the anode and, are displayed at a display and/or are, employed for driving the x-ray tube.

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Patent Owner(s)
Patent Owner | Address | |
---|---|---|
SIEMENS AKTIENGESELLSCHAFT | WERNER-VON-SIEMENS-STRASSE 1 MUENCHEN 80333 |
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Scholz, Bernhard | Heroldsbach, DE | 47 | 1130 |
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Maintenance Fees
Fee | Large entity fee | small entity fee | micro entity fee | due date |
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Fee | Large entity fee | small entity fee | micro entity fee |
---|---|---|---|
Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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