Twin asymmetric scan slice thickness setting method and apparatus and radiation tomography method and apparatus
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United States of America Patent
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Mar 19, 2002
Grant Date -
N/A
app pub date -
Apr 5, 2000
filing date -
Jun 4, 1999
priority date (Note) -
Expired
status (Latency Note)
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Abstract
In order to allow slice thicknesses to be set for a twin asymmetric scan in which a scan is performed with a first slice thickness in a first detector row of a multi detector and with a second slice thickness different than the first slice thickness in a second detector row, first, a position of an X-ray beam is moved and a scan is performed while keeping the width of the X-ray beam fixed at twice the first slice thickness to move the position of the X-ray beam to a position at which count values for the first and second detector rows match (ST2-ST5). The count value for the detector row at this time is stored (ST6). Next, the position of the X-ray beam is moved and a scan is performed while keeping the width of the X-ray beam fixed at the sum of the first and second slice thicknesses to move the position of the X-ray beam to a position at which the count value for the first detector row matches the stored count value (ST7-ST9).
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