Apparatus and method for substantially simultaneous measurement of emissions
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United States of America Patent
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Mar 5, 2002
Issued Date -
N/A
app pub date -
Jun 26, 2000
filing date -
Jun 7, 1999
priority date (Note) -
Expired
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Abstract
An apparatus and method for measuring an emission. A source of all excitation beam is provided. In the path of the excitation beam, means are located for providing one or more daughter beams. The one or more daughter beams are directed at one or more substances. The substances may include one or more known qualified substances, and one or more known unqualified substances. The substances have substantially similar characterizations. Positionable adjacent to the one or more substances are means for generating one or more emission beams. A spectral analysis device is provided for collecting spectral measurements substantially simultaneously from the one or more emission beams. Means are provided for subsequently comparing the spectral measurements from the one or more substances.
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