Monitoring materials
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United States of America Patent
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Mar 5, 2002
Grant Date -
N/A
app pub date -
May 7, 1999
filing date -
May 8, 1998
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The apparatus and method provide techniques for effectively implementing alpha and/or beta and/or gamma monitoring of items or locations as desired. Indirect alpha monitoring by detecting ions generated by alpha emissions, in conjunction with beta and/or gamma monitoring is provided. The invention additionally provides for screening of items prior to alpha monitoring using beta and/or gamma monitoring, so as to ensure that the alpha monitoring apparatus is not contaminated by proceeding direct to alpha monitoring of a heavily contaminated item or location. The invention provides additional versatility in the emission forms which can be monitored, whilst maintaining accuracy and avoiding inadvertent contamination.
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