Current loop comprising a test circuit
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United States of America Patent
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Jan 8, 2002
Grant Date -
N/A
app pub date -
Mar 16, 2000
filing date -
Jul 20, 1998
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The 4 mA-20 mA type or 0-20 mA type current loop connects an analog sensor (1) to an acquisition system (3), respectively carrying a sensor current (Ic) and an acquisition current (Ia). A test circuit is connected in parallel with the current loop to inject a superposition current (Is) into said loop, which current is superposed on the sensor current (Ic) or on the acquisition current (Ia). In a first embodiment, a variable voltage generator (7) injects the superposition current (Is) by adding it to the acquisition current (Ia), thereby making it possible to check a low-current threshold of the acquisition system (3). In a second embodiment, a variable current regulator injects the superposition current (Is) by adding it to the sensor current (Ic), thereby making it possible to check a high-current threshold of the acquisition system. The high- and low-current thresholds of the acquisition system are tested without opening the current loop.
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