Method and apparatus for inspecting streak
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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Jan 1, 2002
Issued Date -
N/A
app pub date -
Jan 12, 2000
filing date -
Jun 26, 1996
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method and an apparatus for inspecting a streak on a sheet object to be inspected are provided. The apparatus includes a micro-filtering unit for enlarging a width of defect data and an unevenness filtering unit connected to the micro-filtering unit in series, for detecting the defect data having a certain measure of width. Inputting image data, which has been taken by a line sensor camera, through an image input unit, the micro-filtering unit outputs data of a microscopic streak with low contrast to the unevenness filtering unit while enlarging the width of the streak.
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