Method for acquiring measurements and scanner with sensor groups
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United States of America Patent
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-
Jan 1, 2002
Grant Date -
N/A
app pub date -
Oct 3, 2000
filing date -
Apr 3, 1998
priority date (Note) -
Expired
status (Latency Note)
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Abstract
To solve a control complexity problem encountered with very numerous detectors of a tomodensitometer, there is provision to group the detectors into groups and to subject all the detectors of a group to the same processing. By way of improvement, the determination of the mode of processing is performed during a view, and the processing is applied to the signals detected during a subsequent view.
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