Optical scheme for high flux low-background two-dimensional small angle x-ray scattering
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United States of America Patent
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Dec 11, 2001
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Dec 17, 1999
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Dec 17, 1999
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Abstract
An x-ray analysis system including a focusing optic for focusing an x-ray beam to a focal point, a first slit optically coupled to the focusing optic, a second slit optically coupled to the first slit, and an x-ray detector, where the focal point is located in front of the detector.
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