Optical system for detecting surface defects, a disk tester and a disk testing method

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United States of America Patent

PATENT NO 6330059
SERIAL NO

09696047

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Annular rays of light are received by a hollow optical member and focused as light beams on the surface of a disk to be tested and as the scattered light from the disk surface travels toward the hollow portion of the optical member, it is received by an objective lens and then received by a light receiver via the objective lens.

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Patent Owner(s)

Patent OwnerAddress
HITACHI ELECTRONICS ENGINEERING CO LTD16-3 HIGASHI 3 CHOME SHIBUYA-KU TOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ishiguro, Takayuki Tokyo, JP 31 313
Nakajima, Hiroshi Tokyo, JP 280 3141

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