Differential comparator with a programmable voltage offset for use in an automatic tester
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United States of America Patent
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Nov 27, 2001
Grant Date -
N/A
app pub date -
Apr 1, 1998
filing date -
Apr 1, 1998
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A test circuit operable to examine both differential outputs and single outputs of a device under test (DUT), the circuit comprises a first circuit having as inputs a first output of the DUT and a first set of independent reference voltages, and an output of the first circuit coupled to a plurality of comparators. The test circuit further comprises a second circuit having as inputs a second output of the DUT and a second set of independent reference voltages, and an output of the second circuit coupled to the plurality of comparators. The test circuit further comprises a select circuit coupled to outputs of the comparators, the output of the first circuit and the output of the second circuit. The select circuit outputting the outputs of the first circuit and the second circuit or outputting the outputs of the comparators.
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