Apparatus and method for testing electric conductivity of circuit path ways on circuit board
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United States of America Patent
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Nov 13, 2001
Grant Date -
N/A
app pub date -
Jan 18, 2000
filing date -
Jan 19, 1999
priority date (Note) -
Expired
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Abstract
A testing apparatus and method for testing conductivity of electric pathways formed on a substrate, each pathway including a first wiring and a second wiring partially overlapping each other. The apparatus includes a first electric signal applier for applying a first electric signal having an electric parameter changing with time to an input portion of the first wiring, a first electrode facing a first portion of the second wiring, a second electrode facing a second portion of the second wiring, a second electric signal applier for applying to the second a electrode a second electric signal changing its electric parameter in the phase reverse to that of the first electric signal, and a monitor for monitoring the signal transmitted to the first electrode through its capacitive coupling.
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