Method and apparatus for analyzing measurements
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United States of America Patent
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Oct 2, 2001
Grant Date -
N/A
app pub date -
Dec 11, 1998
filing date -
Dec 11, 1998
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method, apparatus, and article of manufacture for analyzing measurements. The invention provides a method for separating and analyzing the components of a distribution, such as deterministic and random components. The method performs the steps of collecting data from a measurement apparatus, constructing a histogram based on the data such that the histogram defines a distribution, fitting tails regions wherein deterministic and random components and associated statistical confidence levels are estimated.
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