Method for analyzing measured value by on-line spectral analyzer
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United States of America Patent
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Aug 28, 2001
Grant Date -
N/A
app pub date -
Apr 28, 1999
filing date -
May 12, 1998
priority date (Note) -
Expired
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Abstract
An object to be measured is analyzed by a chemical means or a physical means to make its characteristic value clear, a spectrum of the same object to be measured is obtained by an off-line near infrared spectral analyzer, a calibration indicative of a relation between the spectrum and the characteristic value is obtained, at least one sample is selected from among the same kind of objects to be measured, spectra are obtained by the off-line near infrared spectral analyzer and an on-line near infrared spectral analyzer, a difference between both of the obtained spectra is obtained, a spectrum of the same kind of object to be measured is measured by the on-line near infrared spectral analyzer, the measured spectrum is corrected by the difference between both of the spectra, and the characteristic value of the object to be measured is estimated by using the corrected spectrum and the calibration.
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