Device and method for measuring deformation of a mechanical test specimen
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United States of America Patent
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Aug 28, 2001
Grant Date -
N/A
app pub date -
Apr 14, 2000
filing date -
Jul 21, 1997
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A device for measuring the deformation of a mechanical test specimen, and including a pressing member (3) for stressing a substantially flat specimen (16) in controlled manner by means of a punch (25); a Michelson interferometer having an optical branch (9d) defined optically by a first face (16b) of the specimen (16), and for generating interference images related to the deformation of the specimen (16); a telecamera (44) for acquiring and digitizing the interference images; and a processor (27) for processing the digitized images and controlling the measuring process fully automatically. The interferometer (9) may alternatively perform white light interferometry measurements, ESPI measurements, or ESPI profilometry measurements, by simply substituting the light source and control software.
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