Method and apparatus for measuring properties of materials or structures
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United States of America Patent
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-
Jul 31, 2001
Grant Date -
N/A
app pub date -
Sep 16, 1999
filing date -
Jan 24, 1997
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
Stress wave measuring apparatus includes a Hopkinson bar or pressure bar bundle system comprising an input bar bundle having input bars, and an output bar bundle having output bars 104a. A brittle test specimen is positioned in between the input and output bar bundles. Means is provided to induce a one dimensional compression force into the bar bundles. Instrumentation is introduced onto the input and output bars for measuring values of shear wave or crack propagation. The specimen may be placed under different stress conditions measured by appropriate instrumentation on the bar bundles. In one embodiment, a rod gauge is glued to a rock massive and arranged to measure wave effects generated in the rock massive. Other arrangements provide amplification of the wave effects prior to measurement by instrumentation on the gauge 500.
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