SCSI device available for breakdown prediction and self-examination and a method thereof
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United States of America Patent
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May 22, 2001
Issued Date -
N/A
app pub date -
Jun 26, 1998
filing date -
Jul 10, 1997
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Abstract
A SCSI device available for breakdown prediction and self-examination or a breakdown prediction and self-examination method by this device which increases the overall system performance through reducing the loading of a master I2C processor and SCSI bus, by reporting to the master I2C processor only when necessary, after an I2C processor reads the status of the SCSI device. The SCSI device available for breakdown prediction and self-examination includes a temperature and motor driving sensor, which monitors the temperature and motor driving status of the SCSI device; a power sensor and a power on/off switch, which monitors the SCSI device power and receives a command from the master I2C processor switch on/off the SCSI device power through the I2C processor; a SMART sensor, which monitors the SCSI device status: a device control logic, which reports all the previous status reports, error reports and SMART functions to the master I2C processor through the SCSI controller; an I2C processor, which reports to the master I2C processor 130 through a SCSI channel or I2C channel, when it is needed, by analyzing all information detected by the temperature, motor driving sensor, power sensor, power on/off switch and SMART sensor.
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