Method for forming a spacer for semiconductor manufacture

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United States of America Patent

PATENT NO 6232191
SERIAL NO

09133718

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Abstract

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This invention teaches methods and apparatus for forming self-aligned photosensitive material spacers about protruding structures in semiconductor devices. One embodiment of the invention is a method for forming a LDD structure, utilizing disposable photosensitive material spacers. A second embodiment of the invention comprises a method for forming a transistor, having salicided source/drain regions, utilizing photosensitive polyimide spacers for forming the salicided source/drain regions, without disposing of the spacers. A third embodiment of the invention comprises a method for creating an offset from a protruding structure on a semiconductor substrate, using disposable photosensitive material spacers.

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Patent Owner(s)

Patent OwnerAddress
BREAULT RESEARCH ORGANIZATION INC6400 EAST GRANT ROAD SUITE 350 TUSCON AS 85715

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Jeng, Nanseng Boise, ID 54 764
Pierrat, Christophe Boise, ID 193 6320

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