Method and apparatus for measuring waviness of paper
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United States of America Patent
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Apr 17, 2001
Grant Date -
N/A
app pub date -
Jan 12, 2000
filing date -
Jan 20, 1999
priority date (Note) -
Expired
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Abstract
The invention provides a simple and efficient method and apparatus for carrying out a quantitative measurement of waviness in a sample of paper. This is done by stretching the paper sample to the point where all waviness is removed and measuring the elongation produced at that point. The observation of waviness and its removal is facilitated by illumination of the paper sample with low incidence light while the sample is being stretched.
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