Battery cell inspecting method and apparatus

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United States of America Patent

PATENT NO 6215311
SERIAL NO

09211004

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A battery cell inspection method in which the difference in the measured value in case of normal battery cell insertion and that incase of mistaken battery cell insertion is large to facilitate decision as to whether or not mistaken insertion occurred to enable stable result of decision to be achieved, and in which, if the area of the electrode plate and/or the number of the electrode plates making up a sole battery cell is small, decision as to mistaken insertion can be given easily to assure correct results of decision. To this end, measurement is made of the difference between a measured value of the capacitance across a minus (-) electrode plate 103a of a first cell 101a and a (-) electrode plate 103b of a second cell 101b facing the (-) electrode plate 103a in case the potential across a plus (+) electrode plate 104a of the first cell 101a and a (+) terminal plate 102b of a second cell 101b neighboring to the first cell 101a is caused to fall to a ground potential (for an acceptable article) and a measured value of the capacitance across a minus (-) electrode plate 103a of the first cell 101a and a plus (+) terminal plate 102b of the second cell 101b neighboring to the minus (-) electrode plate 103a of a first cell 101a with a minus (-) electrode plate 103b of the second cell 101b incase the potential across the plus (+) terminal plate 102a of the first cell 101a and a minus (-) electrode plate 103b of the second cell 101b (for a reject).

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Patent Owner(s)

Patent OwnerAddress
SONY CORPORATIONTOKYO 108-0075
FURUKAWA DENCHI KABUSHIKI KAISHA4-1 HOSHIKAWA 2-CHOME HODOGAYA-SHI KANAGAWA-KEN

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hoshino, Kiyotaka Tochigi, JP 2 30
Miyamoto, Noboru Ibaraki, JP 48 680

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