Method of and apparatus for washing photomask and washing solution for photomask

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United States of America Patent

PATENT NO 6209553
SERIAL NO

09504728

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Abstract

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Organic matter and metal impurities present on the surface of a photomask are removed. Foreign matter still adhering to the surface of the photomask is removed with H.sub.2 gas dissolved water. The photomask is dried. Thus provided is a method of washing a photomask in a manner which permits attaining an effect of removing foreign matter equivalent or superior to that of a conventional method with a small amount of chemical solution and reducing the amounts of chemicals and high purity water.

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Patent Owner(s)

Patent OwnerAddress
RENESAS ELECTRONICS CORPORATION2-24 TOYOSU 3-CHOME KOTO-KU TOKYO 135-0061

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kusuhara, Masaki Tokyo, JP 38 313
Nagamura, Yoshikazu Hyogo, JP 18 287
Yamanaka, Koji Tokyo, JP 93 963
Yoshioka, Nobuyuki Hyogo, JP 61 736

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