Method and apparatus for detecting minute irregularities on the surface of an object

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United States of America Patent

PATENT NO 6208417
SERIAL NO

09450949

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The present invention provides a method and apparatus of inspecting a surface of an object article capable of precisely detecting stains or miniature defects present in the object surface. Specifically, the invention provides a method of inspecting surface irregularity of an object article having a surface of uniform or regular brightness, which comprises the steps of: gaining brightness informations for a plurality of two-dimensionally distributed pixels by taking a picture of the article surface; finding stains on the article surface in response to each information obtained in the brightness information gaining step to produce a first output; finding miniature defects smaller in size than a unit pixel in response to each information obtained in the brightness information gaining step to generate a second output; switching the first output and the second output into appropriate electrical signals in an controlled manner; and displaying the switched electrical signals on a display in a viewable condition.

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Patent Owner(s)

Patent OwnerAddress
TOSHIBA ENGINEERING CORPORATIONKAWASAKI-SHI KANAGAWA-KEN 210

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ichiba, Kouzou Tokyo, JP 4 48
Itagaki, Chuji Tokyo, JP 3 20
Itou, Masahiro Machida, JP 18 159

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