Method of manufacturing shallow trench isolation

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United States of America Patent

PATENT NO 6204147
SERIAL NO

09270030

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Abstract

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A method for manufacturing a shallow trench isolation. A substrate is provided, wherein the substrate has a pad oxide on the substrate and a silicon nitride layer on the pad oxide layer, and a trench penetrates through the silicon oxide layer and the pad oxide layer and into the substrate. A first oxide layer is conformally formed on the silicon nitride layer and in the trench. A rapid thermal process is performed. A second oxide layer is formed on the oxide layer to fill the trench. Portions of the first and the second oxide layers are removed to expose the silicon nitride layer.

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Patent Owner(s)

Patent OwnerAddress
UNITED MICROELECTRONICS CORPHSIN-CHU CITY 300

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lan, Shih-Ming Hsinchu, TW 8 42
Liu, Chun-Liang Hsinchu, TW 21 101
Meng, Hsien-Liang Hsinchu, TW 24 162

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