Testing system for measuring and optimising target tracking systems
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United States of America Patent
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Mar 13, 2001
Grant Date -
N/A
app pub date -
Oct 1, 1998
filing date -
Oct 2, 1997
priority date (Note) -
Expired
status (Latency Note)
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Abstract
Described is a testing system which has a target point light source (12), a tracking light source (18) and therebetween a projection wall (24). Associated with the target point light source (12) is a two-axis deflection device (28) which is connected together with a target point computer (14). Associated with the tracking light source (18) is a two-axis scanner device (30) which is connected together with a tracking computer (20). Provided between the tracking light source (18) and the two-axis scanner device (30) is a beam splitter (32) with which a sensor device (42) is associated.
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