Device for measuring the thickness and/or unevenness of wadding or non-wovens
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United States of America Patent
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Mar 13, 2001
Grant Date -
N/A
app pub date -
Nov 19, 1998
filing date -
Mar 27, 1996
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The invention concerns a device for measuring the thickness and or unevenness of wadding or non-wovens. The device has a guide element (30) for the wadding or non-wovens and a thickness sensor (26, 27, 28) which presses the wadding or non-wovens against the guide element and can move relative to the latter, the position of the sensor providing a measure of the thickness and/or unevenness of the wadding or non-wovens. To achieve a simpler and cheaper design without sacrificing measurement accuracy, an individual sensor is provided with a translation element (31) which converts the deflections of the individual sensor in one direction into a path signal available in another direction. This allows signals corresponding to the deflections of several individual sensors to be added together and applied to a single common path measurement system (32).
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