Gel point sensor
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United States of America Patent
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Feb 20, 2001
Grant Date -
N/A
app pub date -
Nov 20, 1998
filing date -
Nov 20, 1998
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Abstract
A comparison of the specular and diffused radiation reflected from a coating can be used in ratio to locate the gel point of the coating, and to monitor coating drying characteristics. This same system may be used to monitor the drying process of the coatings in a lab setting to characterize the drying process, optimize coating quality or optimize mill efficiency. A system implementing the Applicant's method uses a radiation source to illuminate a measurement location on the coating, and then provides a first and second radiation detectors to detect reflected radiation from the coating, originating from the radiation source. One of the radiation detectors is arranged to collect specular radiation. The second detector is arranged to collect only diffused radiation. The ratio of these two values represents information about the location of the gel point for the coating, and coating drying characteristics.
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