Method for manufacturing a semiconductor substrate

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United States of America Patent

PATENT NO 6191007
SERIAL NO

09066971

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Abstract

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Methods for manufacturing semiconductor substrates in which a semiconductor layer for forming semiconductor device therein is formed on a supporting substrate with an insulating film interposed between, with which in forming the semiconductor layer on a substrate on which a buried pattern structure has been formed it is possible to greatly increase the film thickness uniformity of the semiconductor layer and the film thickness controllability, particularly when the semiconductor layer is being formed as an extremely thin film. As a result, it is possible to achieve improved quality and characteristics of the semiconductor substrates and make possible the deployment of such semiconductor substrates to various uses.

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Patent Owner(s)

Patent OwnerAddress
DENSO CORPORATION1-1 SHOWA-CHO KARIYA-CITY AICHI-PREF 448-8661

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Asai, Akiyoshi Aichi-gun, JP 12 857
Enya, Takeshi Nagoya, JP 28 858
Matsui, Masaki Nagoya, JP 62 1452
Ohshima, Hisayoshi Obu, JP 21 1001
Onoda, Kunihiro Nagoya, JP 7 1055
Sakakibara, Jun Anjo, JP 99 1558
Sasaya, Takanari Kariya, JP 7 746
Yamauchi, Shoichi Obu, JP 44 1442

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