Method for detecting the exact contour of targeted treatment areas, in particular, the external contour

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United States of America Patent

PATENT NO 6178345
SERIAL NO

09309097

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Abstract

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A method for mapping surgical target site contours precisely, especially the outer contour thereof, comprises the following steps: producing a plane slice image through the surgery site in the region of the surgery target whereby the plane of the slice image is located substantially perpendicular to a a plane of symmetry of the surgery target site; assigning the images split by the plane of symmetry, more particularly by mirrowing at the plane of symmetry; and establishing the difference in the image contents between the assigned split images and processing the resulting information to determine the location of the contour of the surgery target site, especially the outer contour thereof in the plane of the slice image.

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Patent Owner(s)

Patent OwnerAddress
BRAINLAB AGOLOF-PALME-STRASSE 9 81829 MÜNCHEN 81829

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Birkenbach, Rainer Feldkirchen, DE 39 3613
Vilsmeier, Stefan Poing, DE 100 7944

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