Plasma processing apparatus

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United States of America Patent

PATENT NO 6149760
SERIAL NO

09173179

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Abstract

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An inductively coupled type dry etching apparatus has a spiral RF antenna disposed on the ceiling wall of a process chamber. A susceptor is arranged in the process chamber, for mounting a semiconductor wafer thereon. The ceiling wall has upper and lower layers with a dielectric matrix, and a conductive Faraday shield layer sandwiched therebetween. The Faraday shield layer has a plurality of slits radially arranged. The matrix of the upper and lower layers and the Faraday shield layer are set to have coefficients of thermal expansion close to each other, and/or the Faraday shield layer is set to have a very small thickness.

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Patent Owner(s)

Patent OwnerAddress
TOKYO ELECTRON AT LIMITED1-1 NEKOHAZAMA MENAWARI MATSUSHIMA-MACHI MIYAGI-GUN 981-0202

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hama, Kiichi Chino, JP 16 746

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