Accurate measurement for the concentration of a gas component in a gas mixture, wherein other components influence the concentration analysis
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United States of America Patent
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Nov 14, 2000
Grant Date -
N/A
app pub date -
Dec 29, 1997
filing date -
Dec 30, 1996
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A sensor device and a method for non-dispersive analysis of gas mixtures for determining the concentration of one gas component contained therein, whose absorbency may be influenced as a result of collision broadening by other components contained in a gas mixture (GC). The device includes: a measuring chamber (5), containing the gas mixture; a radiation source (4), emitting radiation (15) through the chamber; detector (10, 14, 16) for receiving radiation passed through the chamber; optical bandpass filters (9a-c) positioned between the detectors and the radiation source, the detectors being coupled with measuring ducts (1-3) or measuring cycles. An optical gas filter (11), contains said gas component or a mixture thereof and is located between the detector and the radiation source. From the first measuring duct is obtained a first signal (S1) and from the second measuring duct is obtained a second signal (S2) relating to radiation also passed through the optical gas filter. Prior to analyses, the amount of a gas component in the gas filter is set at its pressure and/or absorption length or alternatively the effective amount of gas component in its gas mixture either at its fixed concentration and/or at the pressure and/or absorption length (L2) of the mixture to have such a value that: the second signal (S2) and the first signal (S1) are linearly independent of each other and that the second signal and the first signal have a mutual relationship, wherein the variable quantities include at least a collision broadening and a gas component concentration and wherein the coefficients are experimentally determined prior to analyses for accurately determining the effect of a collision broadening.

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Patent Owner(s)
Patent Owner | Address | |
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INSTRUMENTARIUM OY | HELSINKI |
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
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Huiku, Matti | Kaksoiskiventie, FI | 31 | 1889 |
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Fee | Large entity fee | small entity fee | micro entity fee | due date |
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Fee | Large entity fee | small entity fee | micro entity fee |
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Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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