Particle measuring apparatus
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United States of America Patent
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Oct 17, 2000
Grant Date -
N/A
app pub date -
May 1, 1998
filing date -
May 9, 1997
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Abstract
A particle measuring apparatus includes a characteristic parameter extracting device for extracting a plurality of characteristic parameters from each particle in a sample, and a distribution diagram preparing device for preparing a first distribution diagram on the basis of the extracted characteristic parameters. It further includes a first separating device for separating a cluster including target particles from others on the prepared first distribution diagram. In addition, a discriminating device is included for setting a specified discrimination standard for the separated cluster including the target particles and for judging whether the particles in the cluster are target particles or non-target particles on the basis of the discrimination standard. Finally, a counting device is included for counting the number of the target particles on the basis of a discrimination result of the discriminating device.
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